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Name: Dr. Karm Veer Arya Contact: Off: 2449830 Email: kvarya@iiitm.ac.in Areas of Interest: Image Processing, Biometrics, Fault Tolerance computing |
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Dr. Karm Veer Arya has completed his graduation in Science from Vardhaman College Bijnore, India. He achieved the post graduate degree in Electrical Engineering from Indian Institute of Science (I.I.Sc.), Bangalore, India and earned Ph. D. degree in Computer Science & Engineering from Indian Institute of Technology (I.I.T. Kanpur), Kanpur, India.
He started his teaching career in engineering education from Birla Institute of Technology & Science (BITS) Pilani, India. He also served Motilal Nehru National Institute of Technology Allahabad as Lecture (Electronics). From Aug 1996 to Aug. 2008 he was with Department of Computer Science & Information Technology at Institute of Engineering & Technology, M. J. P. Rohilkhand University, Bareilly, India as an Assistant Professor. Since Sept. 2008 he is working as an Associate Professor at ABV-Indian Institute of Information Technology & Management, Gwalior, India. He has more than 17 years of experience to teach the undergraduate and postgraduate classes.
He has published more than 25 journal and conference papers in the area of fault tolerance computing, image processing, biometrics and wireless ad hoc networks. He has delivered numerous invited and plenary conference presentations and seminars throughout the world and chaired the technical sessions in International and national conferences in India and abroad. He has delivered many invited talks in India and abroad. Dr. Arya is on the review panel of IEEE transactions on Systems, Man, and Cybernetics Part-B, Elsevier Pattern Recognition Letters and World Scientific Journal of Interconnection Networks. He has been the member of organizing committee for various national and international seminars/workshops. He is member of IEEE, ACM, and life member of ISTE.Currently his research area includes Biometrics for security, DSP, Wireless Ad Hoc Netowrks, Sensor Networks and Image Processing.